Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis FA. However FA is mainly dealing with detection of consequences of some irreversible event that already happened.
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Books by B. Jayant Baliga
Fundamentals of Power Semiconductor Devices